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SIMON 成像椭圆偏振仪

成像椭圆偏振仪

SIMON成像椭圆偏振仪提供快速、高精度的薄膜厚度和光学常数测量。成像方式可实现大面积并行测量,大幅提升检测效率。

应用领域:

薄膜厚度测量、光学常数分析

核心特点

  • 成像式测量
  • 大面积并行
  • 快速检测
  • 高精度
  • 多种波长选择
  • 自动化分析
产品信息
  • 品牌 PARK SYSTEMS
  • 型号 SIMON
  • 类别 椭圆偏振仪
  • 领域 薄膜测量、光学分析

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