Alemnis公司的NanoIndenter纳米压痕仪是一款结构紧凑，功能多样的仪器，可与众多测试和成像设备集成，并可用于多种不同的应用场景。适用于扫描电子显微镜（SEM）的原位测量，也可用于同步辐射装置和光学显微镜的常规环境中使用。

这款原位纳米压痕仪是可以真正提供形变控制模式的仪器，可为许多材料测试和各种应用领域提供无与伦比的灵活性、准确性和真正的原位纳米机械性能测试。

Alemnis的纳米压痕仪可经过改装，升级模块后，可在高剪切应变下进行动态机械性能测试，并可在超高温条件下进行测试。

The Idea of Nanoindentation
In Nanoindentation, a sample is indented with a small diamond tip (tip radius some nm).
In situ Nanoindentation can give more information on the formation and propagation of mechanically induced dislocations and defects during the experiment.
The In Situ Nanoindenters are compact, robust, versatile and can be fitted to various kinds of microscopes such as Scanning Electron Microscopes (SEM), light microscopes, Synchrotron beamlines, and many more. The idea of nanoindentation arose from the realization that an indentation test is an excellent way to measure very small volumes of materials.

Experimental Aspects
• Successfully address metrology challenges like Mechanical Strength (Elastic Modulus, Hardness, Fracture), Interfacial Adhesion and Failure
• Characterization of microstructural changes with sub-nanometer resolution in an in-situ vacuum environment
• Characterizing the mechanical properties of surfaces or structures IN-SEM and IN-AIR
• Characterization of organic, inorganic, soft or hard materials and coatings
• Nanomechanical characterization with direct observation

Understanding material behavior at the micro-and nano-scale

• Compact and robust design in a stand-alone instrument that is easy to install and remove and which can operate in any position(horizontal, vertical or tilted).

System Specifications 
• Primary indentation mode: True displacement
• Customizable software
• Standalone instrument, operating in SEM or in ambient
• Maximum indentation load: 0.5 N (standard) and 2.5 N (optional)
• Indentation load RMS noise: 4 μN* (0.5 N range) and 20 μN* (2.5 N range)
• Maximum indentation depth: 40 μm
• Indentation depth RMS noise: 1 nm*
• XY closed loop sample micro-positioning system with 26 mm range
• Z closed loop indenter tip micro-positioning system with 22 mm range
• XYZ micro-positioning system resolution: 1.2 nm
• Maximum recommended test area: 10 x 10 mm
• Heating/Cooling Options: -120°C up to 1000°C
• Strain Rate Options: controlled strain rate up to 10’000 s-1
• Weight: ~ 500 g